Publikationsansicht

Neural Network Determination of Optical Phase Correction in a Plane Shear Layer Using Parallel Optoelectronic Image Processing and Global Optical Flow Diagnostics (1998)

Abstract
Neural networks that allow aero-optic phase correction to be made using localized measurements without an external probe beam are being developed in an information-rich laboratory environment. The neural networks are trained to relate phase corrections to low-order modal descriptions of a plane shear layer obtained by a proper orthogonal decomposition (POD) applied to index of refraction data. Optical measurements are taken in a plane shear layer between two uniform streams with different temperatures. The training sequence will use actuators to influence the flow, thus providing the networks with a broader operational range. Elements critical to the training include development of a three-dimensionally interconnected hig frame rate optoelectronic smart camera, extraction of the velocity field using two scalars, and determination of modal coefficients in a low-order description of the flow. The ultimate objective is to simultaneously determine teh three-dimensional index of refraction field and the resulting optical phase front distortion in the plane shear layer, thereby providing real-time correlation between index variation and optical phase shift to the neural networks.

Details der Publikation
Download http://handle.dtic.mil/100.2/ADA351961
Mitarbeiter GEORGIA INST OF TECH ATLANTA SCHOOL OFMECHANICAL ENGINEERING
Archiv Defense Technical Information Center OAI-PMH Repository (United States)
Keywords ELECTROOPTICAL AND OPTOELECTRONIC DEVICES, CYBERNETICS, *SHEAR PROPERTIES, *IMAGE PROCESSING, *NEURAL NETS, *PARALLEL PROCESSING, *OPTICAL ANALYSIS, *PHASE CONTROL, VELOCITY, MEASUREMENT, OPTICAL PROPERTIES, OPTICS, PROBES, GLOBAL, ELECTROOPTICS, TRAINING, REAL TIME, LAYERS, RATES, SEQUENCES, PHASE, VARIATIONS, THREE DIMENSIONAL, CORRELATION, COEFFICIENTS, DIAGNOSIS(GENERAL), INDEXES, EXTERNAL, ACTUATORS, FLOW, FRAMES, SCALAR FUNCTIONS, REFRACTION, DECOMPOSITION, DETERMINATION, ORTHOGONALITY, PHASE DISTORTION, CORRECTIONS, PHASE SHIFT., *OPTICAL PHASE CORRECTIONS, *OPTICAL FLOW DIAGNOSTICS, PLANE SHEAR LAYERS, *OPTOELECTRONIC PROCESSING, PE61102F
Sprache eng