Publikationsansicht

Statistics on VLSI Designs. (2002)

Abstract
This paper presents a statistical study of the components on VLSI chips. We examine the size and shape of components, and their placement over the chip area. The data is useful for building efficient VLSI design tools: the form of the distribution shows that some simple strategies can lead to efficient algorithms, and the parameters of the distribution aid in choosing program parameters. To illustrate the application of the statistics to VLSI design tasks, we present an algorithm for solving the 'rectangle intersection' problem that arises in design rule checkers. (Author)

Details der Publikation
Mitarbeiter CARNEGIE-MELLON UNIV PITTSBURGH PA DEPT OF COMPUTER SCIENCE
Archiv Defense Technical Information Center OAI-PMH Repository (United States)
Keywords ELECTRICAL AND ELECTRONIC EQUIPMENT, *PARAMETERS, *STATISTICAL TESTS, *INTEGRATED CIRCUITS, ALGORITHMS, EXPERIMENTAL DATA, SHAPE, STATISTICAL SAMPLES, DATA ACQUISITION, COMPUTER APPLICATIONS, CIRCUIT ANALYSIS., *VLSI(Very Large Scale Integration)
Sprache eng