| Archiv |
Fraunhofer Publica (Germany) |
| Keywords |
DLTS-Methode,
Grenzflächenzustand,
Leitwertmethode,
MBS-Struktur,
Methode(quasistatisch)
|
| Typ |
Book Article
|
| Sprache |
english
|
| Verknüpfungen |
Kassabov, J.: Physical problems in microelectronics. Proceedings of the 4th International School, ISPPME '85, Varna, Bulgaria, Mai 12.-18. Singapore: World Scientific, 1985, pp. 325-379 : Abb.,Tab.,Lit.
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