Publikationsansicht

The investigation of mos interface properties by capacitance methods (1985)

Details der Publikation
Archiv Fraunhofer Publica (Germany)
Keywords DLTS-Methode, Grenzflächenzustand, Leitwertmethode, MBS-Struktur, Methode(quasistatisch)
Typ Book Article
Sprache english
Verknüpfungen Kassabov, J.: Physical problems in microelectronics. Proceedings of the 4th International School, ISPPME '85, Varna, Bulgaria, Mai 12.-18. Singapore: World Scientific, 1985, pp. 325-379 : Abb.,Tab.,Lit.