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Thin layers and multilayers of porous silicon X-ray diffraction investigation (1998) |
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Details der Publikation |
| Archiv |
Fraunhofer Publica (Germany) |
| Typ |
Journal Article
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| Sprache |
english
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| Verknüpfungen |
Journal of applied physics, Vol.83 (1998), No.11, pp.5814-5822
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