| X-ray reflectivity of a Langmuir monolayer on water (1987) | |||||||||||||||
Abstract | |||||||||||||||
| We built a special Langmuir through allowing the use of X-ray reflectivity. Using the device we studied for the first time the density profile of a Langmuir monolayer directly on water. This experiment opens new prospects in particular to measure the roughness of solid films on water subphase. | |||||||||||||||
Details der Publikation | |||||||||||||||
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