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39077681
Effect of annealing under stress on defect structure of Si-Ge (2008)
A. Misiuk
,
N.V. Abrosimov
,
P. Romanowski
,
J. Bak-Misiuk
,
A. Wnuk
,
B. Surma
,
W. Wierzchowski
,
K. Wieteska
,
W. Graeff
,
M. Prujszczyk
Abstract
Journal article
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