| Influence of tip-sample interaction in a time-domain terahertz scattering near field scanning microscope (2008) | |||||||||||||
Abstract | |||||||||||||
| Apertureless near field measurements with a metallic tip are performed in the terahertz frequency range. Lateral scans are recorded for different time delays within a terahertz pulse. The forward scattered terahertz signal strongly depends on the time delay. At larger time delays, the tip-sample interaction leads to additional structures in the scan that do not correspond to a change in topography or dielectric function. | |||||||||||||
Details der Publikation | |||||||||||||
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