| Storage device performance prediction with CART models (2004) | |||||||||||||||||
Abstract | |||||||||||||||||
| Storage device performance prediction is a key element of self-managed storage systems and application planning tasks, such as data assignment. This work explores the application of a machine learning tool, CART models, to storage device modeling. Our approach predicts a device’s performance as a function of input workloads, requiring no knowledge of the device internals. We propose two uses of CART models: one that predicts per-request response times (and then derives aggregate values) and one that predicts aggregate values directly from workload characteristics. After being trained on our experimental platforms, both provide accurate black-box models across a range of test traces from real environments. Experiments show that these models predict the average and 90th percentile response time with an relative error as low as 16%, when the training workloads are similar to the testing workloads, and interpolate well across different workloads. Acknowledgements: We thank the members and companies of the PDL Consortium (including EMC, Hewlett-Packard, Hitachi, Hitachi | |||||||||||||||||
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