Minkevich, A. A., Fohtung, E., Slobodskyy, T., Riotte, M., Grigoriev, D., Schmidbauer, M., ...
Coherent x-ray diffractive imaging is extended to high resolution strain analysis in crystalline nanostructured devices. The application potential is demonstrated by determining the strain...
Minkevich, A.A., Baumbach, T., Gailhanou, M., Thomas, O.
Physical Review B, 78(2008) S.174110/1-8
Minkevich, A. A., Gailhanou, M., Charlet, B., Chamard, V., Thomas, O.
The displacement field in highly non uniformly strained crystals is obtained by addition of constraints to an iterative phase retrieval algorithm. These constraints include direct space density...