Zeitraum
2008 - 2008
Anzahl
3
Co-Autoren
Effect of annealing under stress on defect structure of Si-Ge (2008)
A. Misiuk, N.V. Abrosimov, P. Romanowski, J. Bak-Misiuk, A. Wnuk, ...
Journal article
Defects in Si-Ge Annealed under High Hydrostatic Pressure 2008-06-15 - 2008-06-20
A. Misiuk, K. Wieteska, J. Bak-Misiuk, W. Wierzchowski, ...
Poster
Defects in Single Crystalline Ge-Doped Silicon Revealed by Annealing Under High Hydrostatic 2008-08-23 - 2008-08-31
A. Misiuk, B. Surma, A. Wnuk, J. Bak-Misiuk, ...