Irradiation Qualification Tests in Electronic Devices and Circuits (1991)
Benemann, A., Boden, A., Bräunig, D., Brumbi, D., Klein, J. W., Schott, J. U., ...
The Effects of Radiation on Electronic Devices and Circuits (1990)
Benemann, A., Boden, A., Bräunig, D., Brumbi, D., Klein, J. W., ...
Radiation damage of semiconductor components constitutes a safety risk for the functioning of circuits when operated in a radiation-exposed environment. Despite the manifold dependences of the...
The intrinsic states and fixed charges of the Si-SiO2 interface. (1989)
Klausmann, E., Fahrner, W.R., Bräunig, D.
The four types of charges currently encountered in the Si-SiO sub 2 structure are first re-defined and the presently recommanded terminology and symbolism given. The interface states can exchange...
The electronic states of the Si-SiO2 interface. (1989)
Klausmann, E., Fahrner, W.R., Bräunig, D.
The presence of carrier traps, at the Si-SiO2 interface, is at the origin of various instability phenomena encountered both in bipolor and FET devices, and described at length in Chaps. 14 and 15...