D. Buttard

The growth of small diameter silicon nanowires to nanotrees (2008)

Gentile, P, David, T, Dhalluin, F, Buttard, D, Pauc, N, Den Hertog, M, ...

In this work we have studied a way to control the growth of small diameter silicon nanowires by the vapour-liquid-solid (VLS) mode. We have developed a method to deposit colloids with good density...

Dislocation strain field in ultrathin bonded silicon wafers studied by grazing incidence x-ray diffraction (2002)

Eymery, J., Buttard, D., Fournel, F., Moriceau, H., Baumbach, G.T., Lübbert, D.

An ultrathin silicon layer (16 nm) bonded onto a silicon wafer is studied by grazing incidence x-ray diffraction. We measure satellite peaks around the {220} reflections coming from two periodic...

X-ray diffuse scattering of p-type porous silicon (2002)

Buttard, D., Bellet, D., Dolino, G., Baumbach, T.

Grazing incidence x-ray studies of twist-bonded Si/Si and Si/SiO2 interfaces (2000)

Buttard, D., Eymery, J., Rieutord, F., Fournel, F., Lübbert, D., Baumbach, T., ...

X-ray Reflectivity Investigation of Thin P-Type Porous Silicon Layers (1999)

Buttard, D., Dolino, G., Bellet, D., Baumbach, T., Rieutord, F.

X-ray reflectivity (XRR) was used to investigate the p- and p+ -type porous Silicon (PS) layers. For p- -type samples, a linear dependence of the thickness versus the anodization time was revealed in...

Thin layers and multilayers of porous silicon X-ray diffraction investigation (1998)

Buttard, D., Bellet, D., Dolino, G., Baumbach, T.