RELIABILITY PHYSICS STUDIES ON TRANSISTORS. (1998)
Scarlett, Robert M., Riddle, Grant C.
The report describes work on the second breakdown phenomenon in transistors. Section 1 deals with a comparison of electrical test methods for observing the onset of the thermal instability which...
RELIABILITY PHYSICS STUDIES ON TRANSISTORS. (1998)
Scarlett, R. M., Riddle, Grant C.
Section 1 deals with the general theory of lateral instability and electrical test methods for detecting it. A general model is set up, from which the criterion for stability can be determined under...