N. Hrauda, J.J. Zhang, J. Stangl, A. Rehman-Khan, ...
Contribution to a conf. proceeding (journal)
N. Hrauda, J.J. Zhang, M. Stoffel, J. Stangl, ...
Contribution to a conf. proceeding (journal)
Crystal Truncation Planes Revealed by 3D Reconstruction of Reciprocal Space (2008)
I.A. Vartanyants, A.V. Zozulya, K. Mundboth, O.M. Yefanov, ...
Journal article
Imaging of nanoislands in coherent grazing-incidence small-angle x-ray scattering experiments (2008)
A.V. Zozulya, O.M. Yefanov, I.A. Vartanyants, K. Mundboth, C. Mocuta, ...
Journal article
Imaging of nanoislands in coherent grazing-incidence small-angle x-ray scattering experiments (2008)
A.V. Zozulya, O.M. Yefanov, I.A. Vartanyants, K. Mundboth, C. Mocuta, ...
Journal article
Beyond the ensemble average: X-ray microdiffraction analysis of single SiGe islands (2008)
C. Mocuta, J. Stangl, K. Mundboth, T.H. Metzger, G. Bauer, ...
Journal article
Study of Relaxation of Strain in Patterned Structures using X-Ray Diffraction Technique (2006)
A. Rehman-Khan, J. Stangl, G. Bauer, D. Buca, B. Hollander, ...
Journal article
Epitaxially grown GaP/GaAs1-xPx/GaP double heterostructure nanowires for optical applications (2005)
Svensson, CPT, Seifert, W, Larsson, MW, Wallenberg, LR, Stangl, J, Bauer, G, ...
We demonstrate metal organic vapour phase epitaxy growth of GaP/GaAs1-xPx/GaP double heterostructure nanowires on GaP(111)B, and report bright photoluminescence at room temperature. By using...
Structural properties of semiconductor nanostructures from x-ray scattering (2004)
Stangl, J., Schülli, T., Hesse, A., Holý, V., Bauer, G., Stoffel, M., ...
Shape and composition change of Ge dots due to Si capping (2004)
Kirfel, O., Müller, E., Grützmacher, D., Kern, K., Hesse, A., Stangl, J., ...
Stangl, J., Hesse, A., Holý, V., Zhong, Z., Bauer, G., Denker, U., ...
Structural properties of SiGe islands: Effect of capping (2003)
Stangl, J., Hesse, A., Holý, V., Bauer, G., Denker, U., Schmidt, O. G., ...
Non-specular X-ray reflection from self-organized ripple structures in Si/Ge multilayers (2002)
Meduňa, M., Holý, V., Stangl, J., Hesse, A., Roch, T., Bauer, G., ...
The ripples at the interfaces of five-period Si/Ge multilayer samples, grown on 0.3degrees miscut (0 0 1) Si are studied systematically. Five samples with Si spacer layer thicknesses ranging from...
Effect of overgrowth on shape, composition, and strain of SiGe islands on Si(001) (2002)
Hesse, A., Stangl, J., Holý, V., Roch, T., Bauer, G., Schmidt, O. G., ...
We present a method and results based on x-ray scattering capable of resolving the shape and strain distribution in buried islands, as well as their vertical composition gradient. As an example,...
Strain and composition distribution in uncapped SiGe islands from x-ray diffraction (2001)
Stangl, J., Daniel, A., Holý, V., Roch, T., Bauer, G., Kegel, I., ...
Lateral Arrangement of Self-Assembled Quantum dots in an SiGe/Si Superlattice (1999)
Bauer, G., Darowski, N., Holy, V., Lübbert, D., Pietsch, U., Zerlauth, S., ...
Lateral ordering of self-organized quantum dots in a SiGe/Si (001) multilayer has been investigated by grazing incidence x-ray diffraction and Monte Carlo growth simulation. It has been demonstrated...
A. Rehman-Khan, J. Stangl, G. Bauer, D. Buca, ...
Conference presentation
Investigations on ordered arrays of SiGe-islands 2007-10-04 - 2007-10-06
N. Hrauda, J. Stangl, G. Bauer
Talk
N. Hrauda, J.J. Zhang, M. Stoffel, J. Stangl, ...
Poster
N. Hrauda, J.J. Zhang, J. Stangl, A. Rehman-Khan, ...
Conference presentation
N. Hrauda, J.J. Zhang, M. Stoffel, J. Stangl, ...
Poster
Strain Distribution in buried SiGe Islands 2009-01-30 - 2009-01-30
N. Hrauda, J.J. Zhang, M. Stoffel, J. Stangl, ...
Poster
Local Probe X-ray Diffraction from Single Nanowires 2008-12-01 - 2008-12-05
J. Stangl, B. Mandl, V. Chamard, M. Keplinger, ...
Conference presentation
J. Stangl, C. Mocuta, K. Mundboth, A. Diaz, ...
Conference presentation