Investigation of residual dislocations in VGF-grown Si-doped GaAs (2005)
Birkmann, B., Stenzenberger, J., Jurisch, M., Härtwig, J., Alex, V., Müller, G.
2K PL topography of silicon doped VGf-GaAs wafers (2002)
Baeumler, M., Maier, M., Herres, N., Bünger, T., Stenzenberger, J., Jantz, W.
We report on full wafer and small area photoluminescence topography investigations of VGF GaAs:Si wafers. The wavelength-specific images exhibit various correlations and anti-correlations. Intensity...