Farbbildauswertung zur prozeßfolgenden Sichtprüfung (1995)
Geißelmann, H., Burkhard, M., Hättich, W.
Color processing is very important for inspection of natural products and also for products which are produced in pharmaceutic and food industries. Using line scan cameras, a high throughput can be...
Farbbildauswertung zur prozeßfolgenden Qualitätssicherung (1993)
Geißelmann, H., Burkhard, M., Hättich, W.
Color processing is very important for inspection of natural products and also for products which are produced in pharmaceutic and food industries. Using line scan cameras, a high throughput can be...
Kroneberger, K., Rothard, H., Burkhard, M., Kemmler, J., Koschar, P., Heil, O., ...
We present results of the secondary electron emission coefficient γ from thin foi1 targets (2 to 25µg/cm2), for which we measured the secondary electron yields in backward (γb) as well as...
REFRACTION OF DIRECTED SHOCK ELECTRONS AT PLANAR SOLID SURFACES (1989)
Rothard, H., Kroneberger, K., Burkhard, M., Biedermann, C., Kemmler, J., Heil, O., ...
Shock electrons are ejected in a direction perpendicular to the shock front of the wake cone, the ion induced collective electron density fluctuation in the electron plasma of the solid. They have...
Kroneberger, K., Rothard, H., Burkhard, M., Kemmler, J., Koschar, P., Heil, O., ...
We present results of the secondary electron emission coefficient γ from thin foi1 targets (2 to 25µg/cm2), for which we measured the secondary electron yields in backward (γb) as well as...
REFRACTION OF DIRECTED SHOCK ELECTRONS AT PLANAR SOLID SURFACES (1989)
Rothard, H., Kroneberger, K., Burkhard, M., Biedermann, C., Kemmler, J., Heil, O., ...
Shock electrons are ejected in a direction perpendicular to the shock front of the wake cone, the ion induced collective electron density fluctuation in the electron plasma of the solid. They have...
Kroneberger, K., Rothard, H., Burkhard, M., Kemmler, J., Koschar, P., Heil, O., ...
We present results of the secondary electron emission coefficient γ from thin foi1 targets (2 to 25µg/cm2), for which we measured the secondary electron yields in backward (γb) as well as in...
REFRACTION OF DIRECTED SHOCK ELECTRONS AT PLANAR SOLID SURFACES (1989)
Rothard, H., Kroneberger, K., Burkhard, M., Biedermann, C., Kemmler, J., Heil, O., ...
Shock electrons are ejected in a direction perpendicular to the shock front of the wake cone, the ion induced collective electron density fluctuation in the electron plasma of the solid. They have...
Kroneberger, K., Rothard, H., Burkhard, M., Kemmler, J., Koschar, P., Heil, O., ...
We present results of the secondary electron emission coefficient γ from thin foi1 targets (2 to 25µg/cm2), for which we measured the secondary electron yields in backward (γb) as well as in...
REFRACTION OF DIRECTED SHOCK ELECTRONS AT PLANAR SOLID SURFACES (1989)
Rothard, H., Kroneberger, K., Burkhard, M., Biedermann, C., Kemmler, J., Heil, O., ...
Shock electrons are ejected in a direction perpendicular to the shock front of the wake cone, the ion induced collective electron density fluctuation in the electron plasma of the solid. They have...
DEPENDENCE OF CONVOY ELECTRON EMISSION ON SURFACE PROPERTIES AND TARGET MATERIAL (1987)
Rothard, H., Burkhard, M., Biedermann, C., Kemmler, J., Kroneberger, K., Koschar, P., ...
The influence of surface properties on the convoy electron emission from sputter-cleaned solid surfaces (C, Al, Ni, Cu, Pd, Ag, Sm, Gd, Au and Bi) induced by both light ions (H+, H2+) and heavy ions...
SHOCK ELECTRONS FROM ION-SOLID PENETRATION (1987)
Rothard, H., Burkhard, M., Kemmler, J., Biedermann, C., Kroneberger, K., Koschar, P., ...
Angular distributions of low energy electrons (Ee
DEPENDENCE OF CONVOY ELECTRON EMISSION ON SURFACE PROPERTIES AND TARGET MATERIAL (1987)
Rothard, H., Burkhard, M., Biedermann, C., Kemmler, J., Kroneberger, K., Koschar, P., ...
The influence of surface properties on the convoy electron emission from sputter-cleaned solid surfaces (C, Al, Ni, Cu, Pd, Ag, Sm, Gd, Au and Bi) induced by both light ions (H+, H2+) and heavy ions...
SHOCK ELECTRONS FROM ION-SOLID PENETRATION (1987)
Rothard, H., Burkhard, M., Kemmler, J., Biedermann, C., Kroneberger, K., Koschar, P., ...
Angular distributions of low energy electrons (Ee
DEPENDENCE OF CONVOY ELECTRON EMISSION ON SURFACE PROPERTIES AND TARGET MATERIAL (1987)
Rothard, H., Burkhard, M., Biedermann, C., Kemmler, J., Kroneberger, K., Koschar, P., ...
The influence of surface properties on the convoy electron emission from sputter-cleaned solid surfaces (C, Al, Ni, Cu, Pd, Ag, Sm, Gd, Au and Bi) induced by both light ions (H+, H2+) and heavy ions...
SHOCK ELECTRONS FROM ION-SOLID PENETRATION (1987)
Rothard, H., Burkhard, M., Kemmler, J., Biedermann, C., Kroneberger, K., Koschar, P., ...
Angular distributions of low energy electrons (Ee
DEPENDENCE OF CONVOY ELECTRON EMISSION ON SURFACE PROPERTIES AND TARGET MATERIAL (1987)
Rothard, H., Burkhard, M., Biedermann, C., Kemmler, J., Kroneberger, K., Koschar, P., ...
The influence of surface properties on the convoy electron emission from sputter-cleaned solid surfaces (C, Al, Ni, Cu, Pd, Ag, Sm, Gd, Au and Bi) induced by both light ions (H+, H2+) and heavy ions...
SHOCK ELECTRONS FROM ION-SOLID PENETRATION (1987)
Rothard, H., Burkhard, M., Kemmler, J., Biedermann, C., Kroneberger, K., Koschar, P., ...
Angular distributions of low energy electrons (Ee
Target ionization and projectile electron loss in simple collision systems (1984)
Schader, J., Latz, R., Burkhard, M., Frischkorn, H.J., Hofmann, D., Koschar, P., ...
Absolute double differential cross sections for target ionization and projectile electron loss were measured in collisions of H+, H+ 2, 3He+ and 3He++ (0.4 to 2.0 MeV/u) with He and Ar at electron...
Target ionization and projectile electron loss in simple collision systems (1984)
Schader, J., Latz, R., Burkhard, M., Frischkorn, H.J., Hofmann, D., Koschar, P., ...
Absolute double differential cross sections for target ionization and projectile electron loss were measured in collisions of H+, H+ 2, 3He+ and 3He++ (0.4 to 2.0 MeV/u) with He and Ar at electron...
Target ionization and projectile electron loss in simple collision systems (1984)
Schader, J., Latz, R., Burkhard, M., Frischkorn, H.J., Hofmann, D., Koschar, P., ...
Absolute double differential cross sections for target ionization and projectile electron loss were measured in collisions of H+, H+ 2, 3He+ and 3He++ (0.4 to 2.0 MeV/u) with He and Ar at electron...
Target ionization and projectile electron loss in simple collision systems (1984)
Schader, J., Latz, R., Burkhard, M., Frischkorn, H.J., Hofmann, D., Koschar, P., ...
Absolute double differential cross sections for target ionization and projectile electron loss were measured in collisions of H+, H+ 2, 3He+ and 3He++ (0.4 to 2.0 MeV/u) with He and Ar at electron...