Abstract — A novel technique is presented for the accurate, rapid, high frequency, predictive modeling of parallel plate capacitors with gridded plates manufactured in a multilayer low temperature...
Using multivariate nested distributions to model semiconductor manufacturing processes (1999)
David S. Gibson, Ravi Poddar, Gary S. May, Senior Member, Martin A. Brooke
Abstract—This paper demonstrates the advantages of modeling semiconductor process variability using a multivariate nested distribution. This distribution allows estimation not only of correlation...
Ravi Poddar, Emily M. Moon, Student Member, Martin A. Brooke, Nan Marie Jokerst
Abstract—A novel technique is presented for the high speed, accurate, predictive modeling of arbitrary geometry integrated resistor structures manufactured in a variety of technologies, including...
Statistically based parametric yield prediction for integrated circuits (1997)
David S. Gibson, Ravi Poddar, Gary S. May, Senior Member, Martin A. Brooke
Abstract—This paper presents a novel procedure for predicting integrated circuit parametric performance and yield when provided with sample transistor test results and a circuit schematic. Two...
Bruce Burton, Associate Member, Farrukh Kamran, Ronald G. Harley, Thomas G. Habetler, Senior Member, ...
Abstract—Artificial neural networks (ANN’s), which have no off-line pretraining, can be trained continually on-line to identify an inverter-fed induction motor and control its stator currents....
Statistically based parametric yield prediction for integrated circuits (1997)
David S. Gibson, Ravi Poddar, Gary S. May, Senior Member, Martin A. Brooke
Abstract—This paper presents a novel procedure for predicting integrated circuit parametric performance and yield when provided with sample transistor test results and a circuit schematic. Two...