Feature Selection for trouble shooting in complex assembly lines (2007)
Pfingsten, T., Herrmann, D.J.L., Schnitzler, T., Feustel, A., Schölkopf, B.
The final properties of sophisticated products can be affected by many unapparent dependencies within the manufacturing process, and the products’ integrity can often only be checked in a final...
Feature Selection for trouble shooting in complex assembly lines (2007)
Pfingsten, T., Herrmann, D.J.L., Schnitzler, T., Feustel, A., Schölkopf, B.
The final properties of sophisticated products can be affected by many unapparent dependencies within the manufacturing process, and the products integrity can often only be checked in a final...
Bayesian Active Learning for Sensitivity Analysis (2006)
Designs of micro electro-mechanical devices need to be robust against fluctuations in mass production. Computer experiments with tens of parameters are used to explore the behavior of the system, and...
Model-based Design Analysis and Yield Optimization (2006)
Pfingsten, T., Herrmann, D., Rasmussen, C.E.
Fluctuations are inherent to any fabrication process. Integrated circuits and micro-electro-mechanical systems are particularly affected by these variations, and due to high quality requirements the...
Statistical Analysis of Slow Crack Growth Experiments (2006)
A common approach for the determination of Slow Crack Growth (SCG) parameters are the static and dynamic loading method. Since materials with small Weibull module show a large variability in...