T. Sulzbach

Bimodal atomic force microscopy imaging of isolated antibodies in air and liquids (2008)

Martínez, N.F., Lozano, J.R., Herruzo, E.T., García, F., Richter, C., Sulzbach, T., ...

We have developed a dynamic atomic force microscopy (AFM) method based on the simultaneous excitation of the first two flexural modes of the cantilever. The instrument, called a bimodal atomic force...

Recent improvements in the integration of field emitters into scanning probe microscopy sensors (2008)

Beuer, S., Rommel, M., Petersen, S., Amon, B., Sulzbach, T., Engl, W., ...

Recent improvements in the fabrication of integrated field emitters with a control electrode into scanning probe microscopy sensors are presented and discussed. Compared to earlier work the precursor...

Influence of the cantilever holder on the vibrations of AFM cantilevers (2007)

Rabe, U., Hirsekorn, S., Reinstädtler, M., Sulzbach, T., Lehrer, C., Arnold, W.

Dynamic techniques exploiting the vibration of atomic force microscope (AFM) cantilevers are often superior to quasi-static operation, in particular with respect to the signal-to-noise ratio. Tapping...

Recent improvements in the integration of field emitters into scanning probe microscopy sensors: Poster at MNE 2007, 33rd International Conference on Micro- and Nano-Engineering 2007, Copenhagen, Denmark (2007)

Beuer, S., Rommel, M., Petersen, S., Amon, B., Sulzbach, T., Engl, W., ...

Recent improvements in the integration of field emitters into scanning probe microscopy sensors: Poster at MNE 2007, 33rd International Conference on Micro- and Nano-Engineering 2007, Copenhagen, Denmark (2007)

Beuer, S., Rommel, M., Petersen, S., Amon, B., Sulzbach, T., Engl, W., ...

Verfahren zur Erzeugung von Submikrometer-Strukturen an einer ausgepraegten Topographie (2007)

Lehrer, C., Beuer, S., Engl, W., Richter, C., Sulzbach, T.

DE 102007056992 A1 UPAB: 20090609 NOVELTY - The method involves forming a layer sequence on a topography i.e. substrate (1) with an elevation (1a), for covering the substrate, where the sequence has...

Integration of field emitters into scanning probe microscopy sensors using focused ion and electron beams (2004)

Lehrer, C., Frey, L., Petersen, S., Ryssel, H., Schäfer, M., Sulzbach, T.

Material processing by focused ion-beam milling and electron-beam-induced deposition was applied for the integration of field emitters into scanning probe microscopy (SPM) sensors. Geometry of the...

High-resolution constant-height imaging with apertured silicon cantilever probes (2001)

Dziomba, T., Danzebrink, H.U., Lehrer, C., Frey, L., Sulzbach, T., Ohlsson, O.

We present high-resolution aperture probes based on noncontact silicon atomic force microscopy (AFM) cantilevers for simultaneous APM and near-infrared scanning near-field optical microscopy (SNOM)....

Fabrication of silicon aperture probes for scanning near-field optical microscopy by focused Ion beam nano machining (2001)

Lehrer, C., Frey, L., Petersen, S., Sulzbach, T., Ohlsson, O., Dziomba, T., ...

Evaluating probes for "electrical" atomic force microscopy (2000)

Stephenson, Robert, De Wolf, Peter, ...

Ion beam-treated silicon probes operated in transmission and cross-polarized reflection mode near- infrared scanning near-field optical microscopy (NIR-SNOM) (1999)

Dziomba, T., Sulzbach, T., Ohlsson, O., Lehrer, C., Frey, L., Danzebrink, H.U.

Nano-slit probes for near-field optical microscopy fabricated by focused ion beams (1999)

Danzebrink, H.U., Dziomba, T., Sulzbach, T., Ohlsson, T., Lehrer, C., Frey, L.

Characterization of conductive probes for atomic force microscopy (1999)

Kulisch, W, Oesterschulze, E, ...

Evaluating probes for "electrical" atomic force microscopy (1999)

Stephenson, Robert, De Wolf, Peter, ...